February 2011 – Experience the latest developments in powder analysis at Booth #3982. Hosokawa will introduce three new powder analyzing devices at The PITTCON Conference and Exposition in Atlanta, Georgia from March 14th to March 17th . The latest revolution in powder analysis is expected to reach the North American market this spring but you can be among the first to witness some of the most exciting advancements in powder analysis technology.
|Hosokawa e200 LS – Air Jet Sieve The e200 LS is the world’s most advanced and efficient air jet sieving apparatus available. This new system has integrated the sieving device with an analytical computer to bring users a compact, intuitive system for fast, accurate and reliable particle size analysis.
|Hosokawa Powder Characteristics Tester PT-X Hosokawa’s Powder Tester PT-X employs the methods developed by Ralph L. Carr (Carr Indices) to determine the “Flowability & Floodability” of dry powders. The model PT-X is the latest design of the Hosokawa Micron Powder Characteristics Tester which utilizing state of the art features to identify the specific characteristics of powdered samples for a wide range of application fields.
The most current model PT-X, has been equipped with features suggested by many global users of earlier models, making the PT-X the most technologically advanced instrument to measure powder flow characteristics.
|Hosokawa Peneto Analyzer PNT-N The Peneto measures powder wettability, specifically speed and weight of liquids that penetrate the powder layer. This gives affinity between liquid and powder. This method is widely used in pharmaceutical and chemical industries to evaluate the surface characteristics between powder materials and various liquids.
Though these devices are not available for sale in North America until spring of 2011, limited pre-orders are being
accepted. Test models will be available at Hosokawa’s Summit, New Jersey facility. For more information about
Hosokawa Micron Powder Systems’ equipment, technologies and educational programs please visit
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